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Wavetek ANT-20E manuals

ANT-20E first page preview

ANT-20E

Brand: Wavetek | Category: Test Equipment
Table of contents
  1. Table Of Contents
  2. Functions
  3. Recording selected bytes (Overhead Capture)
  4. The "Byte Capture" dialog
  5. Recording results
  6. Recording TCM frames
  7. Recording further SOH/TOH or POH bytes
  8. Measuring the APS switching or dead time
  9. Setting the switch event
  10. Performing an APS measurement
  11. specifications
  12. APS switching time measurement
ANT-20E first page preview

ANT-20E

Brand: Wavetek | Category: Test Equipment
ANT-20E first page preview

ANT-20E

Brand: Wavetek | Category: Test Equipment
Table of contents
  1. Table Of Contents
  2. Table Of Contents
  3. Table Of Contents
  4. Table Of Contents
  5. Table Of Contents
  6. Concatenation options
  7. OC-12c/STM-4c options
  8. OC-48c/STM-16c options
  9. OC-48c/STM-16c
  10. Operation
  11. Generator section
  12. Clock generation and bit rates
  13. Overhead generation
  14. VC-4c path overhead (POH), high-order
  15. Virtual concatenation (VC-4-4v)
  16. Virtual concatenation
  17. OC-12c/STM-4c anomaly insertion
  18. OC-12c/STM-4c defect generation
  19. Payload generation
  20. ATM generator section
  21. Defect generation
  22. Background load
  23. Digital signal inputs
  24. Signal input [16], electrical
  25. Measurement modes
  27. Anomaly measurements
  28. Defect detection
  29. Payload
  31. ATM performance measurements
  32. AAL-1 reassembly
  33. Digital signal output
  34. Signal output [46], electrical
  35. SDH and SONET TX signals
  36. Overhead generator
  37. Path overhead (POH), high-order
  38. Generation of pointer actions
  39. OC-48c/STM-16c defect generation
  41. ATM generator for STS-12c SPE/VC-4-4c container
  45. Signal input [43], electrical
  46. SDH and SONET RX signals
  47. Evaluation of path overhead (POH)
  48. Measurement of AU pointer actions
ANT-20E first page preview

ANT-20E

Brand: Wavetek | Category: Test Equipment
Table of contents
  1. Table Of Contents
  2. Table Of Contents
  3. STM-1 C4, ATM in 155.52 Mbit/s mapping
  4. STS-3c, ATM in 155.52 Mbit/s mapping
  5. STS-1, ATM in 51.840 Mbit/s mapping
  6. E4, ATM in 139.264 Mbit/s mapping
  7. Error insertion (anomalies)
  8. E3, ATM in 34.368 Mbit/s mapping
  10. E1, ATM in 2.048 Mbit/s mapping
  11. DS3, ATM in 44.736 Mbit/s mapping (PLCP, HEC based)
  12. Alarm generation (defects)
  13. Error measurement (anomalies)
  14. HEC-based Mapping
  15. Alarm detection (defects)
  16. DS1, ATM in 1.544 Mbit/s mapping
  18. STM-1 C3, ATM in 155.52 Mbit/s mapping
  19. STS-1 SPE, ATM in 44.736 Mbit/s mapping
ANT-20E first page preview

ANT-20E

Brand: Wavetek | Category: Test Equipment
Table of contents
  1. Table Of Contents
  2. Table Of Contents
  3. Table Of Contents
  4. Table Of Contents
  5. Table Of Contents
  6. Main applications of the Broadband Analyzer/Generator
  7. Application concept
  8. Test applications
  9. UNI signaling tests
  10. Using and setting up the Broadband Analyzer/Generator
  11. Overview: Virtual Instruments, "VIs"
  12. Often used terminology
  13. ATM Test Control
  14. ATM Test Control" window layout and commands
  15. Important dialog windows
  16. ATM Test Results
  17. Results window
  18. ATM Channel Explorer
  19. ATM Channel Explorer" window layout and commands
  21. Instrument Configuration
  22. Port configuration
  23. Tx/Rx Configuration
  24. Edit Signal Structure"
  25. The "Address Input" dialog
  26. Test Types
  27. The "Test Setup" dialog: Setting the Test Type
  28. The "ATM Layer QoS - Looped Topology" test type
  29. The "ATM Layer QoS (PVC) - Point-to-point" test type
  30. The "ATM Layer QoS (PVC) - Looped" test type
  31. The "ATM Layer QoS (SVC) - Calling" test type
  32. The "ATM Layer QoS (SVC) - Self Call" test type
  33. The "Test Setup <...>" dialog: Configure test type
  34. Select channel
  35. Header
  36. Called party address
  37. Source parameters
  38. Multiplexer
  39. Defining Virtual Channels
  40. Parameter display and modification (index cards)
  41. The "Header/Address" index card
  42. The "Traffic Contract" index card
  43. The "Traffic Contract" index card (continued)
  44. The "Traffic Source" index card
  45. The Application Manager
  46. Starting and Stopping the Measurement
  47. ATM Layer Quality of Service Measurements (SVC)
  48. Test setup and description
  49. Configuring the Instrument: "ATM Test Control" VI
  50. Selecting the Test Type: "ATM Test Control" VI
  51. Configuring the Test Type: "ATM Test Control" VI
  52. ATM Test Control" VI
  54. Inserting Errors: "ATM Test Control" VI
  55. Displaying the Results: "ATM Test Results" VI
  56. Displaying the Signaling Analysis
  57. The "Quality Of Service" window
  58. The "Receiver Status" window
  59. Detecting and analyzing ATM channels (Channel Explorer)
  61. Measurement
  62. Analyzing the AAL types of active ATM channels
  63. Displaying the AAL Type Distribution
  64. ATM Channels where alarms are present
  65. Selecting Options
  66. Sorting Channels
  67. ATM Traffic Generation and Multiplexing
  68. Generator Principle
  69. Constant Bit Rate" source model
  70. On-Off" source model
  71. Traffic Control and Multiplexing Method
  72. Traffic Shaper
  73. Testing Switched Virtual Circuits (SVCs)
  74. Starting and stopping signaling, generating test traffic
  75. Called" mode
  76. Self Call" mode
  77. Generator
  78. General Functions
  79. ATM Layer Quality of Service Measurements
  80. Source Models
  82. Traffic Shaper for VBR and SBR Traffic Contracts
  83. Descrambling
  85. Alarm Detection (Defects)
  86. Channel Explorer
  87. AAL analysis
  88. Traffic Contracts
ANT-20E first page preview

ANT-20E

Brand: Wavetek | Category: Test Equipment
Table of contents
  1. Table Of Contents
  2. Table Of Contents
  3. Table Of Contents
  4. Table Of Contents
  5. Table Of Contents
  6. Table Of Contents
  7. Optical interfaces for signals up to STM-64/OC-192
  8. Optical power splitter
  9. STM-16/OC-48 Module connector panel
  10. STM-64/OC-192 Module connector panel
  11. Important safety instructions
  12. Cleaning the optical interfaces
  13. Installing the optical interface
  14. Important operating information
  15. Installation instructions STM-16/OC-48
  16. Installation instructions STM-64/OC-192
  17. Affixing the laser safety warning labels
  18. Generator section
  19. Clock generator and bit rates
  20. STM-0 TX signal
  21. Overhead generator
  22. Error insertion (anomalies)
  23. Alarm generator (defects)
  24. Output signals for the ADM Tester
  25. Digital signal inputs
  26. Signal input [16], electrical
  27. SDH and SONET RX signals
  28. Descrambling
  29. transport overhead (TOH) evaluation
  30. Wavelength ranges
  31. Functions
  32. Clock generator
  33. Defect generation
  34. Signal outputs
  35. Signal inputs
  36. Digital signal output
  37. Signal output [46], electrical
  38. Clock output [41]
  42. Receiver section
  43. Signal input [43], electrical
  45. Measurement modes
  46. Transport overhead (TOH) #1 evaluation
  47. Optical power splitter BN 3035/90.49
  48. Drop&Insert / Through Mode
  52. LINE/AUXILIARY signal input [12], electrical
  53. Additions for SOH
  56. Specifications STM-64/OC
  58. SDH and SONET TX signals
  60. ITU-T Standard
  61. ANSI Standard
  64. Outputs for RX clock and frame trigger
  66. Section overhead (SOH) #1 to #64 Transport overhead (TOH) #1 to #192 evaluation
  68. Note for ANT-20SE users
ANT-20E first page preview

ANT-20E

Brand: Wavetek | Category: Test Equipment
Table of contents
  1. Table Of Contents
  2. Table Of Contents
  3. ANT-20 NEXT software
  4. About this operating manual
  5. Installing the ANT-20 NEXT software
  6. Backup
  7. Overview of standard applications
  8. Basic information on running applications
  9. Performing optional measurements
  10. Applications for 2 Mbit/s signals
  11. Line 2 Mb/s, unknown structure
  12. full test (approx. 25 min)
  14. Applications for 34 Mbit/s signals
  15. Line 34 Mb/s, unknown structure
  17. Applications for STM-1
  18. Line STM-1, unknown structure
  19. Line STM-1 VC-4, full check (approx. 25 min)
  20. Line STM-1, Digital Radio, full check (approx. 25 min)
  21. For user in a hurry"
  22. Starting the ANT-20 NEXT software
  23. Evaluating and recording the diagnosis
  24. For advanced users
  25. Loading an application
  26. Application menu
  27. Creating a new icon (shortcut)
  28. Starting the diagnosis
  29. Aborting a diagnosis
  30. Reporting the results
  31. Report structure
  32. Saving the report
  33. Loading a report
  34. Creating and customizing applications
  35. Customizing an application
  36. Saving a (new) application
ANT-20E first page preview

ANT-20E

Brand: Wavetek | Category: Test Equipment
Table of contents
  1. Table Of Contents
  2. Table Of Contents
  3. General information
  4. Tributary channel numbering
  5. Overhead generation
  6. STM-1 error insertion (anomalies)
  7. STM-1 alarm generation (defects)
  8. Pointer action generation
  9. STM-1 error measurements (anomalies)
  10. STM-1 alarm detection (defects)
  11. Measurement of AU and TU pointer actions
  12. VC-4 Path Overhead (POH), High Order
  13. VC-3 Path Overhead (POH), High Order
  14. VC-4/VC-3 Path Overhead (POH)
  15. C-12 mapping (2 Mbit/s in STM-1, AU-3/AU-4)
  16. VC-12 Path Overhead contents
  17. VC-12 alarm generation (defects)
  18. VC-12 alarm detection (defects)
  19. C-3 mapping (34/45 Mbit/s in STM-1, AU-3/AU-4)
  20. VC-3 Path Overhead contents (Low Order)
  21. VC-3 alarm generation (defects)
  22. VC-3 alarm detection (defects)
  23. C-4 mapping (140 Mbit/s in STM-1/STS-3c)
  24. VC-11 Path Overhead contents
  25. VC-11 alarm generation (defects)
  26. VC-11 alarm detection (defects)
  27. C-2 mapping (6.3 Mbit/s in STM-1, AU-3/AU-4, TU-2)
  28. VC-2 Path Overhead contents
  29. VC-2 alarm generation (defects)
  30. VC-2 alarm detection (defects)
  31. Functions
  32. Clock generator
  33. Overhead generator
  34. Signal outputs
  35. Signal inputs
  36. LINE/AUXILIARY signal input [12], electrical
ANT-20E first page preview

ANT-20E

Brand: Wavetek | Category: Test Equipment
Table of contents
  1. Table Of Contents
  2. Table Of Contents
  3. Multiplex and demultiplex functions
  4. Testing switch and sensor functions
  5. Generator section
  6. Justification as per T1.107 or T1.107a
  7. Test signals for bit error rate measurements
  8. Receiver section
  9. Evaluation of test signals for bit error measurements
  10. Functions
  11. Clock generator
  12. Measurements
  13. Signal inputs
  14. LINE/AUXILIARY signal input [12], electrical
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