Zeiss Axioplan 2 imaging and Axiophot 2 manuals
Axioplan 2 imaging and Axiophot 2
Table of contents
- Table Of Contents
- Notes on the safe operation of the instrument
- General
- Purpose
- Overview and Connections
- Putting into Operation
- Stand
- Manual stand
- Stand E/Stand mot
- Light manager
- Microscope control software AxioVision Control
- Electrical connections
- System Overview
- Microscope Components
- Microscope illuminators
- Tubes
- Eyepieces
- Intermediate tubes
- Reflector modules
- Objectives
- Stages
- Condensers for Transmitted Light
- Analyzers, compensators, auxiliary objects and DIC sliders
- Axiophot 2 Photo module
- Microscopy Techniques
- Transmitted light darkfield
- Darkfield illumination in low magnifications
- Phase contrast
- DIC Differential interference contrast in transmitted light
- Transmitted light polarization Determining and measuring path differences
- Transmitted light polarization Determining the optical characteristics of crystals
- Incident light brightfield
- Incident light darkfield
- DIC Differential interference contrast in incident light
- Incident light polarization Detection of bireflection and reflection pleochroism
- Epi Fluorescence
- Photomicrography with the Axiophot 2
- technical data
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