ADTRAN 200410L1 User Manual

Contents

Chapter 1. Introduction1-8 ESU LT User Manual 61200410L1-1Pattern GenerationThe ESU LT offers five test patterns: 511, QRSS, 1:8, All Ones,and All Zeros.511 The 511 pattern is generated and checked by the Nx56K/64K serial interface. It only appears in the TS0s assigned tothe Nx56K/64K port.When used in conjunction with the payload loopback atthe far end, an end-to-end integrity check can be made onthe DTE ports.QRSS The ESU LT has an internal QRSS pattern generator anddetector. The pattern appears only in the TS0s assigned tothe Nx56K/64K port. The QRSS test pattern can be used inconjunction with network loopbacks to perform end-to-end tests.1:8 The 1:8 is a stress pattern which places the maximum num-ber of 0s in the transmitted data. This is always done overall time slots.This pattern is used in conjunction with external test equip-ment to determine if the E1 line is performing acceptablyunder a stress condition. Each channel of the E1 has onlyone bit set.All Zeros Generates an all zeros pattern in every channel.All Ones Generates an all ones pattern in every channel.