ANSI07000198.vsdSMAI1:13BLOCKDFTSPFC^GRP1_A^GRP1_B^GRP1_C^GRP1_NTYPESPFCOUTAI3PAI1AI2AI3AI4AINSMAI1:1BLOCKDFTSPFC^GRP1_A^GRP1_B^GRP1_C^GRP1_NTYPESPFCOUTAI3PAI1AI2AI3AI4AINSMAI1:25BLOCKDFTSPFC^GRP1_A^GRP1_B^GRP1_C^GRP1_NTYPESPFCOUTAI3PAI1AI2AI3AI4AINANSI07000199 V1 EN-USFigure 108: Configuration for using an instance in task time group 2 as DFT reference.Assume instance SMAI4:16 in task time group 2 has been selected in the configuration to controlthe frequency tracking for all instances. Observe that the selected reference instance (i.e.frequency tracking master) must be a voltage type. Observe that positive sequence voltage isused for the frequency tracking feature.For task time group 1 this gives the following settings (see Figure 106 for numbering):SMAI1:1 – SMAI12:12:DFTReference =ExternalDFTRef to use DFTSPFC input as reference (SMAI4:16)For task time group 2 this gives the following settings:SMAI1:13:DFTRefExtOut =DFTRefGrp4 to route SMAI4:16 reference to the SPFCOUT output,DFTReference =DFTRefGrp4 for SMAI1:13 to use SMAI4:16 as reference (see Figure 108) SMAI2:14 –SMAI12:24:DFTReference =DFTRefGrp4 to use SMAI4:16 as reference.For task time group 3 this gives the following settings:SMAI1:25 – SMAI12:36:DFTReference =ExternalDFTRef to use DFTSPFC input as reference(SMAI4:16)21.12 Test mode functionality TEST IP1647-1 v221.12.1 Application M11407-3 v8The protection and control IEDs may have a complex configuration with many included functions.To make the testing procedure easier, the IEDs include the feature that allows individual blockingof a single-, several-, or all functions.This means that it is possible to see when a function is activated or trips. It also enables the userto follow the operation of several related functions to check correct functionality and to checkparts of the configuration, and so on.Section 21 1MRK 511 364-UUS ABasic IED functions292Application manual
