Standard 25 ICS3-10 B 40-029 e 01/983.6 Measurement of lengthsThe measurement of lengths using the Standard 25 ICS requires the following, for example: stage micrometer, positive 5 + 100/100 y D = 0.17 mmand eyepiece crossline micrometer 10:100, d = 26 mmAn overview of available stage micrometers and eyepiece reticles is given in chapter 1.6.Before the length measurement using the microscope can be performed, the micrometer or scale valueof the used objective / eyepiece reticle combination must be determined. This scale value is exactly thatdistance in the specimen which complies to one interval of the used eyepiece crossline micrometer.For calibration, align the scales of the stage micrometer and the crossline micrometer parallel to eachother by turning the eyepiece, and make the zero lines of both scales exactly congruent. If, for example,99 increments (of 20 μm each) of the stage micrometer correspond to exactly 100 increments of thecrossline micrometer, as in Fig. 3-10, the resulting scale value k’ for the used objective / eyepiece reticlecombination (A-Plan 10x/0.25 and crossline micrometer 10:100) isThe distance to be measured should be 5 mm in the intermediate eyepiece image in order tokeep the influence of random measuring deviations as low as possible.Other measuring errors may occur if the eyepiece has not been inserted into the tube untilstop.After exchange of the stage micrometer for thespecimen to be measured, the measuring distanceof interest results from the number of incrementsof the eyepiece crossline micrometer (tenthestimated) multiplied by the scale value k’.Example:L = 35.5 x 9.9 mm = 351.5 μmParticularly large object structures can also bedetermined by using the vernier scale gradations(0.1 mm) on the mechanical stage. Here, it mightbe necessary to determine the distance to bemeasured through calculation from a combined xand y measurement (Pythagoras).Fig. 3-10 Measurement of lengthsk' = 99100 x 10 m = 9.9 m