A F IRST M EASUREMENT48Preparing the instrumentIMPORTANT• Never touch the cantilever or the surface of the sample! Good results relyheavily on a correct treatment of the tip and the sample.• Avoid exposing the system to direct light while measuring. This couldinfluence the beam deflection detector and reduce the quality of themeasurement.Prepare the instrument as follows (see chapter Preparing for Measurement(p.36) for more detailed instructions):- If you have the AFM Dynamic Module, install an NCLR type cantilever,otherwise install an CONTR type cantilever.- Install one of the samples from the Nanosurf AFM Basic sample kit orCalibration sample kit. Preferably install the 10 μm Calibration gridwhen using a 70μm or 110μm scan head and the 660 nm Calibration gridwhen using a 10μm scan head.The measurement examples shown here were made with the 10 μm Cali-bration grid.To make sure that the configuration is correct, do the following:- Open the User interface dialog via the menu ‘Options/Config User Inter-face...’.- Select the ‘Easy level’ user interface mode.- Open the menu item ‘File>Parameters>Load...’, and load the file‘Default_EZ2-AFM.par’ from the directory with default easyScan 2 con-figurations. Usually this is ‘C:\Program Files\Nanosurf\Nansurf easyScan2 software\Config’.Entering values in the control panelsTo change a parameter in any panel, use on of the following methods:• Activate the parameter by clicking it with the mouse pointer, or by select-
