IEC07000199-2-en.vsdSMAI1:13BLOCKDFTSPFC^GRP1L1^GRP1L2^GRP1L3^GRP1NSPFCOUTAI3PAI1AI2AI3AI4AINSMAI1:1BLOCKDFTSPFC^GRP1L1^GRP1L2^GRP1L3^GRP1NSPFCOUTAI3PAI1AI2AI3AI4AINSMAI1:25BLOCKDFTSPFC^GRP1L1^GRP1L2^GRP1L3^GRP1NSPFCOUTAI3PAI1AI2AI3AI4AINIEC07000199 V3 EN-USFigure 104: Configuration for using an instance in task time group 2 as DFT reference.Assume instance SMAI4:16 in task time group 2 has been selected in the configuration tocontrol the frequency tracking for all instances. Observe that the selected reference instance(i.e. frequency tracking master) must be a voltage type. Observe that positive sequencevoltage is used for the frequency tracking feature.For task time group 1 this gives the following settings (see Figure 102 for numbering):SMAI1:1 – SMAI12:12:DFTReference =ExternalDFTRef to use DFTSPFC input as reference(SMAI4:16)For task time group 2 this gives the following settings:SMAI1:13:DFTRefExtOut =DFTRefGrp4 to route SMAI4:16 reference to the SPFCOUT output,DFTReference =DFTRefGrp4 for SMAI1:13 to use SMAI4:16 as reference (see Figure 104)SMAI2:14 – SMAI12:24:DFTReference =DFTRefGrp4 to use SMAI4:16 as reference.For task time group 3 this gives the following settings:SMAI1:25 – SMAI12:36:DFTReference =ExternalDFTRef to use DFTSPFC input as reference(SMAI4:16)17.12 Test mode functionality TESTMODE IP1647-1 v317.12.1 Application M11407-3 v8The protection and control IEDs may have a complex configuration with many includedfunctions. To make the testing procedure easier, the IEDs include the feature that allowsindividual blocking of a single-, several-, or all functions.This means that it is possible to see when a function is activated or trips. It also enables theuser to follow the operation of several related functions to check correct functionality and tocheck parts of the configuration, and so on.1MRK 504 158-UEN A Section 17Basic IED functions257Application manual
