Genie Nano-CL Series™ Genie Nano Specifications • 25Defective Pixel Specification for Models 5100/4090These defective pixel specifications in the following table are as published by the sensormanufacturer. Genie Nano cameras apply defective pixel corrections to improve the cameraperformance.Defective Pixels(max: 1000)Number of defective pixels allowed in the full window size of 5120 x 5120(i.e. model 5100).For mono devices: A defective pixel is defined as a pixel which has a response thatdeviates 102 LSB10 in a dark image or a corrected gray image, or a saturated image,from the local median of the neighboring pixels in a 7 x 7 block.For color devices: The pixels are divided per color channels (R, G1, G2, B) and thencalculated with the same methodology as mono devices.The defective pixels in dark, gray and saturated images are stored a in a global defectmap. The limit is applied to the global defect map.Defective Column0 defective columns allowedNumber of defective columns in the full window size of 5120 x 5120 derived from dark,half scale and saturated image.For Mono devices: A bad column is defined as a column which has a response thatdeviates 48 LSB10 in a dark image, or a corrected gray or a saturated image, from thelocal median of 11 neighboring columns (+/- 5 left/right columns).For Color devices: The pixels are divided per color channels (R, G1, G2, B) and thencalculated with the same methodology as mono devices.Defective Row0 defective rows allowedNumber of defective rows in the full window size of 5120 x 5120 derived from dark,half scale and saturated image.For Mono devices: A bad row is defined as a row which has a response that deviates 48LSB10 in a dark image, or a corrected gray or a saturated image, from the localmedian of 11 neighboring rows (+/- 5 top/bottom rows).For Color devices: The pixels are divided per color channels (R, G1, G2, B) and thencalculated with the same methodology as mono devices.continued next page