Keysight E8402A, E8404A C-Size Mainframes User and Service Guide 201TEST Subsystem Programming the Enhanced MonitorTEST[:ALL]?TEST:ALL? performs all the tests in the TEST subsystem except TEST:TIME?.They are performed in the following order: MEMory, SENSe, TEMPerature,DISPlay, BLOWer. Any failure causes an immediate error return. The commandreturns an integer; refer to the table below for valid responses and meaning.Returned DataComments– This is a complete test. It can take up to 7 minutes before it returns.TEST:[:ALL]? interrupts the monitoring function of the enhanced monitor.Measurement levels returned from other commands during a test routinewere all measured before the test routine started.– Executing TEST:RES:VERB? following a test command, returns a stringdescribing the result.Type Range Test Result Codes and Descriptionint16 -32767 to32767result of test. +0 is a successful test.+996 ROM checksum failure+997 RAM test failure+998 VXI communication hardware failure+999 Non-volatile memory corruption+1000 - 1006 Bad internal ground measurements+1007 - 1019 Bad front slot temperature measurement+1020-1032 Bad middle slot temperature measurement.+1033-1045 Bad rear slot temperature measurement.+1046 Bad ambient temperature measurement.+1050-1056 Bad voltage measurement.+1103-1306 Bad A/D or D/A.+1307 Bad multiplexer.+1308 Bad display contrast+1309 Bad front temperature board+1310 Bad middle temperature board+1311 Bad rear temperature board+1312-1381 Bad measurement or ground+1382-1389 Bad fan voltage+1390-1397 Bad impeller measurement+1398-1405 Bad power supply fan 1 measurement.+1406-1413 Bad power supply fan 2 measurement.
