36 Device Description WAGO-I/O-SYSTEM 750750-666/000-003 4FDI/2FDO 24V/10A PROFIsafe V2 iParManualVersion 1.2.0, valid from HW/SW Version 01/014.6.7 Safety Parameters4.6.8 Two-channel Safety Application, Proof Test-Interval 10YearsTable 17: Safety parameters for two-channel safety applicationMaximum Safety integrity Levelacc. EN 62061SIL3Maximum safety integrity levelacc. IEC 61508SIL3Maximum performance levelacc. EN ISO 13849-1Cat. 4/PL eProof test interval 10 yearsProbability of failure PFD,Proof test interval 10 years,(low demand mode) (IEC 61508)for one two-channel output(fieldbus to output)for one input pair(input to fieldbus)for two input pairs and onetwo-channel output (intput tofieldbus and fieldbus to output)8.46 * 10-5 (8.5% of allPFD from 10-3 at SIL3)5.71 * 10-5 (5.71% of allPFD from 10-3 at SIL3)8.50 * 10-5 (8.5% of allPFD from 10-3 at SIL3)Probability of failure PFH,Proof test interval 10 years,(low demand mode) (IEC 61508)for one two-channel output(fieldbus to output)for one input pair(input to fieldbus)for two input pairs and onetwo-channel output (intput tofieldbus and fieldbus to output)1.94 * 10-9 (1.94% of allPFH from 10-7 at SIL3)1.31 * 10-9 (1.31% of allPFH from 10-7 at SIL3)1.95 * 10-9 (1.95% of allPFH from 10-7 at SIL3)Hardware fault tolerance HFT with two-channel application(IEC 61508/EN ISO 13849-1)1 (one error in the application doesnot yet lead to a failure of thesafety equipment)DC (diagnostic coverage level) 94%MTTFd(Mean Time To Failure dangerous)410 years
