Keysight B2900 User’s Guide, Edition 5 6-23Function DetailsTrace BufferTrace BufferThe trace buffer collects the test result data until a buffer full is detected. Themaximum data size is 100,000 blocks for each channel. The data flow is shown inFigure 6-7. One data block may contain multiple data, such as voltage measurementdata, current measurement data, resistance measurement data, source output data,calculation result data, limit test data, time data, and status data. They are selectedby using the Format keys of the I/O key group. See “I/O key group” on page 4-45.For setting the trace buffer, see “Trace Buffer Setup dialog box” on page 4-36.In Figure 6-7, the variables indicate the following data.• VOLT: Voltage measurement data• CURR: Current measurement data• RES: Resistance measurement data• TIME: Time data (timestamp of the measurement start trigger)• STAT: Status data or limit test status• SOUR: Source output data• CALC: Math (calculation) result data or limit test data (= raw data - offset data)If data is stored in the trace buffer, its statistical data can be calculated. Calculablestatistical data is as follows.• MEAN: Mean value• SDEV: Standard deviation• MIN: Minimum value• MAX: Maximum value• PKPK: Peak to peak valueThe statistical data (except for PKPK) of VOLT, CURR, or RES data can bedisplayed on the Trace Statistical Result dialog box. See “Trace Statistical Resultdialog box” on page 4-42 for displaying the data.Use an external computer to display the data which cannot be displayed on theB2900 screen. The data can be saved in an USB memory connected to the frontpanel USB-A connector or can be read by using SCPI commands.
