OPERATIONAxioscope 5/7/Vario Illumination and contrast methods in reflected light … ZEISS03/2018 430035-7344-001 1154.3.2 Setting the reflected light darkfield(1) ApplicationThe reflected light darkfield method is applied when samples are examined which do not have areas withdifferent reflectivity (ideal brightfield samples), but which show scratches, cracks, pores (i.e., deflections)on the plane surface. All such light-scattering details appear bright in the darkfield while the reflectiveplane areas remain dark.(2) Instrumentation− Axioscope with pre-installed LED 10 W illuminator or optionally used with the HAL 100 halogenlamp mounted at the back of the upper part of the stand− Objectives: Epiplan-Neofluar, EC Epiplan-Neofluar, Epiplan with the additional label "HD"− Darkfield ACR P&C reflector module for reflected light in the reflector turret/slider(3) Setting the reflected light darkfield• Adjust the microscope as described in section 4.3.1 H for reflected light brightfield microscopy. The fielddiaphragm image should lie just barely outside of the edge of the field of view to avoid reflections.• Swing the darkfield ACR P&C reflector module for reflected light on the reflector turret into the beampath.• Remove the 6x20 mm compensator slider if mounted.• Swing in the objective position with the darkfield objective (HD) on the nosepiece.• If necessary, swivel in the darkfield reflector module on the reflector turret.• Open the aperture diaphragm fully and switch off or remove neutral filters if applicable.• Place the sample on the stage and adjust the focusing if necessary.
