OPERATIONAxio Vert.A1 Illumination and Contrast Techniques in Reflected Light Carl Zeiss05/2012 431030-7044-001 894.12.2 Reflected Light Dark FieldThe reflected light dark field technique is used when not entirely reflecting surfaces with differences inreflectivity (ideal bright field objects) are examined, but scratches, cracks and pores exist - in short, whenthere are deviations from plane surfaces. All the light-scattering details will light up brightly in the darkfield, while reflecting plane surfaces will remain dark.Requirements− The microscope must have properly been put into operation, as described in Section 3.− The microscope must be switched on.− VIS-LED or HAL 100 reflected light illumination− Objectives for dark field (designation: HD)− P&C dark field moduleSetting Dark Field• Rotate in the dark field objective on the nosepiece.• Open the luminous field and aperture diaphragms completely and switch off or remove the neutral-density filter, as appropriate.• Put on the specimen and focus.
