OPERATIONAxio Scope.A1 Illumination and Contrasting Method Carl ZeissM60-2-0007 e 05/08 834.1.7 Adjusting the Reflected Light/Bright-Field According to KÖHLER(1) ApplicationThe reflected light/bright-field microscopy is the easiest and most commonly used optical microscopymethod. It is used to examine optically opaque specimens or samples as e.g. cut material or wafers.For an imaging result which is as true to the object as possible we need not only consider the so calleddirect bundled beams but just as well the indirect ones, i.e. the beams which diffract and scatter on thesample details. According to ABBE, the image is more true to the object when the fraction of the indirectbundled beams is larger.The bundled light emerging from the reflected light illuminator is reflected on a color-neutral beamsplitter before it passes through the objective which is focused on the specimen surface (so-calledcondenser function). The objective collects the light reflected on the object and creates, with the tubelens, the microscopic intermediate image. This image can then be examined visually or documentedobjectively.(2) Instrumentation− Axio Scope.A1 with adjusted halogen lamp HAL 100 mounted on the reflected light barrel− Reflector module bright-field ACR P&C for reflected light in the reflector turret /slider− Upper stand part HAL 100/HBO 6x HD, DIC with pre-installed aperture and field diaphragm orupper stand part HAL 100/HBO 6x HD, DIC and 2x diaphragm slider 14x40 mm(3) Adjusting the reflected light/bright field− The microscope is in correct operationalmode according to chapter 6 5 7 H 6 5 7 H 3 .− The microscope is switched on.• Switch on halogen lamp HAL 100 on theseparate auxiliary power supply unit (658H658HFig.4-10/1).• Adjust light intensity with the control button onthe auxiliary power supply unit (6 5 9 H 6 5 9 H Fig. 4-10/2).• Put a high-contrast reflected light sample on themicroscope stage.• Swing in objective 10x on the nosepiece (660H660HFig.4-11/6).• Focus the sample with the focusing drive (661H661HFig.4-11/5). Try to focus away from the sample inorder to avoid any collision between objectiveand sample.• Put the knurled button of the aperture diaphragm (6 6 2 H 6 6 2 H Fig. 4-11/2) to a medium position (approx. halfopen and half closed).Fig. 4-10 External auxiliary power supplyunit for HAL 100
