Langer FLS 106 IC User Manual
Also see for FLS 106 IC: User manual
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Contents
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- 5 / 83 -LANGEREMV-TechnikDE-01728 Bannewitzmail@langer-emv.dewww.langer-emv.de FLS 106 IC set / FLS 106 PCB setInstalling the GND 25 Ground Plane for IC Measurements ................................................ 5916.3Installing the GND 25 Holder ........................................................................................ 5916.3.1Installing the GND 25 Ground Plane ............................................................................ 6016.3.2Safety Instructions for GND 25 Groundplane ............................................................... 6016.3.3Installing an ICR Near-Field Microprobe................................................................... 6117Safety Instructions for Installing an ICR Near-Field Microprobe ......................................... 6117.1Laying the Connecting Cables ........................................................................................... 6117.2Connecting the ICR Near-Field Microprobe ....................................................................... 6317.3Installing the BT 706 Bias-Tee ........................................................................................... 6517.4Collision Control of the ICR Probe ..................................................................................... 6617.5Installing a Near-Field Probe with the SH 01 Probe Holder .................................... 6718Installing a Near-Field Probe on the FLS 106 IC ................................................................ 6718.1Connecting a Near-Field Probe Directly to the FLS 106 IC Scanner............................. 6818.1.1Connecting a Near-Field Probe with a Preamplifier ...................................................... 6918.1.2Installing a Near-Field Probe on the FLS 106 PCB ............................................................ 7118.2Connecting a Near-Field Probe Directly to the FLS 106 PCB Scanner ......................... 7218.2.1Connecting a Near-Field Probe with a Preamplifier ...................................................... 7218.2.2Collision Control for the Near-Field Probe.......................................................................... 7318.3Operational Notes....................................................................................................... 7419Checking the Measurement Set-Up before each Use ........................................................ 7419.1Adjusting the Exact Height of the Probe Tip above the DUT .............................................. 7419.2Estimating the Duration of a Measurement with the FLS 106 Scanner .............................. 7519.3Number of Measuring Points ........................................................................................ 7519.3.1Travel Distance ............................................................................................................ 7519.3.2Sweep Time ................................................................................................................. 7519.3.3Transmission Time ....................................................................................................... 7519.3.4Memory and Storage Requirements for the Measurement ................................................. 7619.4After Completing the Measurement .......................................................................... 7720Disassembling after Completing the Measurement(s) ............................................ 7721Removing the ICR Probe ................................................................................................... 7721.1Removing the Near-Field Probe ........................................................................................ 7721.2Removing the SH 01 Probe Holder from the Rotary Unit ................................................... 7721.3Removing the SH 01 Probe Holder from the Aluminum Bracket ........................................ 7721.4Removing the Preamplifier / BT 706 Bias Tee ................................................................... 7821.5Removing a Device Under Test from the T-Slot Table ....................................................... 7821.6Removing a Circuit Board from the UH DUT...................................................................... 7821.7Removing the UH DUT ...................................................................................................... 7821.8 |
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