CHAPTER 1 - SYSTEM OPERATIONLSM 880 Left Tool Area and Hardware Control Tools ZEISS10/2014 V_01 000000-2071-464 141In this case the scanner movement will be restricted to the bleach region zooming in onto this region.This may result in a less accurate positioning of the region as the definition of the region has been madein a different zoom in the image.The bleach process will be faster than without this option. The gain in speed is dependent on the speedthat is used for bleaching. If a high speed has already been chosen for bleaching the gain in speed will beminimal.This function will only be applied for the LSM imaging mode. For widefield modes (WF, SIM, TIRF) itwill be ignoredThe numbers of the different regions will be shown in the image if the check box next to Shownumbers is checked.Regions can be saved by pressing the Save… button using Windows Explorer.This process stores all regions currently displayed in the Regions tool in one file. Saved images can beloaded later on by pressing the Load… button using the Windows Explorer.5.2.15 Multidimensional Acquisition –Z-StackThe Z-Stack tool tab is only available, if the Z-Stack checkbox is ticked in the Multidimensionalacquisition field. If the tool bar is expanded, theZ-Stack tool becomes available (Fig. 192). WhenStart Experiment is pressed the system willperform a Z-Stack.With the Z-Stack function a series of XY-images indifferent focus positions can be acquired resultingin a Z-Stack. In this way a 3 dimensional data setfrom the specimen is obtained.The way in which the Z-Stack is acquired can beselected by pressing either the First/Last orCenter mode buttons. The modes differ in the waythe first and last images of the stack are selected.The Center mode is only available in the Show allmode.In case a Z-Piezo stage insert focusing device isattached to the system, the Piezo device can bechosen for the acquisition of the stack.Fig. 192 Z-Stack tool First/Last mode withZ-Stack Navigation displayed forthe LSM image mode
