CHAPTER 1 - SYSTEM OPERATIONZEISS Left Tool Area and Hardware Control Tools LSM 880166 000000-2071-464 10/2014 V_015.2.20.3 Setting Individual Offset Values for Positions in Position List ModeThe Focus Devices and Strategy tool contains the controls for maintaining focus stability when usingthe Positions tool (e.g. selection of autofocus mode and activity intervals).If Show all is active for the Positions tool, it is possible to assign individual offset values to each positionwhen using the Position List mode. This feature is exclusively available if the autofocus Reflection modeis selected in Focus Devices and Strategy.To modify the offset value of individual positions a position is selected by mouse click.Next, the offset value is either typed into the offset spin box or determined automatically after pressingthe button.Offset values of individual positions must be modified within the context of the Positions tool and not inFocus Devices and Strategy.If individual offset values are specified in position lists, these values are ignored upon switching to anautofocus mode other than Reflection.In the case of the method Sample Carrier, ZEN assumes identical offset values across all positions inarrayed samples. Use the tool Focus Devices and Strategy to specify the offset value when using thismethod. See tool description of Focus Devices and Strategy for details on autofocus modes and offsetvalues (section Acquisition Parameter – Focus Devices and Strategy).Editing offset values of individual positions is available in Position List for the Reflection autofocus mode.5.2.20.4 Lowering Objective when Moving the StageSome acquisition experiments require the objective lens to be lowered (or raised depending on themicroscope) before moving the scanning stage to the next position (e.g. required if certain plate formatsare used).With the tool Positions, this is possible when activating check box.This feature is available to Position List and Sample Carrier if Show all is active.
