Chapter 17 LIN Physical Layer (S12LINPHYV2)MC9S12ZVMB Family Reference Manual Rev. 1.3NXP Semiconductors 56117.3.2.3 Reserved RegisterNOTEThis reserved register is designed for factory test purposes only, and is notintended for general user access. Writing to this register when in specialmode can alter the module’s functionality.17.3.2.4 LIN Slew Rate Mode Register (LPSLRM)1LPWUELIN Wake-Up Enable — This bit controls the wake-up feature in standby mode.0 In standby mode the wake-up feature is disabled.1 In standby mode the wake-up feature is enabled.0LPPUELIN Pullup Resistor Enable — Selects pullup resistor.0 The pullup resistor is high ohmic (330 k).1 The 34 k pullup is switched on (except if LPE=0 or when in standby mode with LPWUE=0)Module Base + Address 0x0002 Access: User read/write(1)1. Read: AnytimeWrite: Only in special mode7 6 5 4 3 2 1 0R Reserved Reserved Reserved Reserved Reserved Reserved Reserved ReservedWReset x x x x x x x x= UnimplementedFigure 17-5. LIN Test registerTable 17-4. Reserved Register Field DescriptionField Description7-0ReservedThese reserved bits are used for test purposes. Writing to these bits can alter the module functionality.Module Base + Address 0x0003 Access: User read/write(1)1. Read: AnytimeWrite: Only in shutdown mode (LPE=0)7 6 5 4 3 2 1 0R LPDTDIS 0 0 0 0 0 LPSLR1 LPSLR0WReset 0 0 0 0 0 0 0 0= UnimplementedFigure 17-6. LIN Slew Rate Mode Register (LPSLRM)Field Description
